Details
Name
Ademar AguiarRole
Centre CoordinatorSince
01st November 1994
Nationality
PortugalCentre
Human-Centered Computing and Information ScienceContacts
+351222094199
ademar.aguiar@inesctec.pt
2026
Authors
Duarte, CE; Harrison, NB; Correia, FF; Aguiar, A; Gonçalves, P;
Publication
ICSA
Abstract
Architectural patterns are frequently found in various software artifacts. The wide variety of patterns and their implementations makes detection challenging with current tools, especially since they often only support detecting patterns in artifacts written in a single language. Large Language Models (LLMs), trained on a diverse range of software artifacts and knowledge, might overcome the limitations of existing approaches. However, their true effectiveness and the factors influencing their performance have not yet been thoroughly examined. To better understand this, we developed MicroPAD. This tool utilizes GPT 5 nano to identify architectural patterns in software artifacts written in any language, based on natural-language pattern descriptions. We used MicroPAD to evaluate an LLM's ability to detect instances of architectural patterns, particularly infrastructure-related microservice patterns. To accomplish this, we selected a set of GitHub repositories and contacted their top contributors to create a new, human-annotated dataset of 190 repositories containing microservice architectural patterns. The results show that MicroPAD was capable of detecting pattern instances across multiple languages and artifact types. The detection performance varied across patterns (F1 scores ranging from 0.09 to 0.70), specifically in relation to their prevalence and the distinctiveness of the artifacts through which they manifest. We also found that patterns associated with recognizable, dominant artifacts were detected more reliably. Whether these findings generalize to other LLMs and tools is a promising direction for future research. © 2026 IEEE.
2025
Authors
Lemos, D; Aguiar, A; Harrison, NB;
Publication
CoRR
Abstract
2025
Authors
Ribeiro, JEF; Silva, JG; Aguiar, A;
Publication
IEEE ACCESS
Abstract
The development of safety-critical systems is heavily governed by domain-specific standards. In the aerospace industry, the DO-178C-Software Considerations in Airborne Systems and Equipment Certification-serves as the primary certification standard used by agencies such as the FAA and EASA to review and approve software-based systems. Although DO-178C aims to ensure system safety while providing evidence for certification, it does not prescribe a specific software development process, allowing flexibility for traditional Waterfall, Agile, or hybrid methods with appropriate adaptations for the aerospace context. This study proposes Scrum4DO178C, an Agile process based on Scrum, to meet the demanding requirements of aerospace software, including safety, robustness, reliability, and integrity. Scrum4DO178C introduces novel process enhancements specifically tailored to meet these criticality needs, while aligning with the standard. Unlike previous proposals that lack detail, this research presents a comprehensive, validated process applied in a real-world industry project at the highest criticality level (Level A - Catastrophic), offering insights beyond theoretical scenarios. The findings demonstrated that the Scrum4DO178C process improves project performance, allows frequent and manageable requirement changes, reduces Verification & Validation (V&V) effort, and increases efficiency while maintaining full compliance with DO-178C. The study also identifies areas for further improvement and suggests exploring the process in additional case studies, both within the aerospace industry and other domains with similarly stringent safety-critical requirements. Finally, it confirms that appropriate automation, namely for documentation production, is a central element to further improve the process.
2025
Authors
Peter, S; Kropp, M; Aguiar, A; Anslow, C; Lunesu, MI; Pinna, A;
Publication
XP
Abstract
2025
Authors
Marchesi, L; Goldman, A; Lunesu, MI; Przybylek, A; Aguiar, A; Morgan, L; Wang, X; Pinna, A;
Publication
XP Workshops
Abstract
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