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Publications

Publications by José Machado da Silva

1999

ADC testing using joint time-frequency analysis

Authors
Mendonca, HS; Silva, JM; Matos, JS;

Publication
THIRD INTERNATIONAL CONFERENCE ON ADVANCED A/D AND D/A CONVERSION TECHNIQUES AND THEIR APPLICATIONS

Abstract
An account is given on the joint time-frequency analysis (JTFA) and the short time-frequency transform algorithm in particular as an alternative technique for dynamic testing of analog to digital converters (ADCs). It is shown that this technique can lead to a significant improvement in ADC testing mainly due the possibility of using non-stationary signals allowing a more rapid test capable of analyzing even localized features.

1995

Use of power supply current and output voltage observation for testing large mixed-signal devices

Authors
da Silva, JM; Matos, JS; Bell Ian, M; Taylor Gaynor, E;

Publication
Midwest Symposium on Circuits and Systems

Abstract
Power supply current monitoring is a promising technique for the development of new test methodologies for analogue and mixed-signal circuits, following the success attained in the digital domain. This paper shows that improved test efficiency and confidence is obtained when both functional output voltage and power supply current signals are observed. Results obtained from simulation of a number of circuits are presented comparing Fault Coverage, Normalised Deviation, and the Coefficient of Variation of faulty responses deviation amplitudes. Also, different test stimuli are compared to evaluate their suitability for testing.

1996

Evaluation of iDD/vOUT cross-correlation for mixed current/voltage testing of analogue and mixed-signal circuits

Authors
Machado Da Silva, J; Silva Matos, J;

Publication
Proceedings of the 1996 European Conference on Design and Test, EDTC 1996

Abstract
The use of cross-correlation between power supply current and output voltage dynamic responses is presented as a methodology for improved mixed current /voltage testing of analogue and mixed-signal circuits. Results obtained from simulations are presented which show that better fault coverage and a simplification of test circuitry can be obtained, when compared with the results obtained from the direct observation of the individual signals. These advantages are important factors to develop viable new design for testability and buil-in self test techniques. © 1996 IEEE.

1996

Use of power supply current and output voltage observation for testing large mixed-signal devices

Authors
daSilva, JM; Matos, JS; Bell, IM; Taylor, GE;

Publication
38TH MIDWEST SYMPOSIUM ON CIRCUITS AND SYSTEMS, PROCEEDINGS, VOLS 1 AND 2

Abstract

1996

Mixed current/voltage observation towards effective testing of analog and mixed-signal circuits

Authors
DaSilva, JM; Matos, JS; Bell, IM; Taylor, GE;

Publication
JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS

Abstract
Power supply current monitoring is a promising technique for the development of new test methodologies for analog and mixed-signal circuits. The advantages of efficiency and reduced test time have already been recognized in the digital domain. This paper shows that improved test efficiency and detection confidence are obtained when both output voltage and power supply current are observed. Results found from the simulation of two circuits are presented comparing fault detection ratios and the amplitude of faulty response deviations when observing each one of these signals. Cross-correlation between output voltage and power supply current is presented as a means to perform a single mixed current/voltage testing operation, providing at the same time increased efficiency. It allows also for simplifications on test circuitry and processing, as reductions on the sampling rates and amplitude resolutions used to acquire the signals provide the same fault coverage levels obtained using higher fidelity measurements.

1997

Using power supply current monitoring and P1149.4 for parametric testing of passive components

Authors
Machado da Silva, J; Silva Matos, J;

Publication
Proceedings of 1997 IEEE International Symposium on Circuits and Systems. Circuits and Systems in the Information Age ISCAS '97

Abstract

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