1994
Authors
DASILVA, JAPM;
Publication
EDN
Abstract
1996
Authors
daSilva, JM; Matos, JS;
Publication
EUROPEAN DESIGN & TEST CONFERENCE 1996 - ED&TC 96, PROCEEDINGS
Abstract
The use of cross-correlation between power supply current and output voltage dynamic responses is presented as a methodology for improved mixed current/voltage testing of analogue and mixed-signal circuits. Results obtained from simulations are presented which show that better fault coverage and a simplification of test circuitry can be obtained, when compared with the results obtained from the direct observation of the individual signals. These advantages are important factors to develop viable new design for testability and built-in self test techniques.
1997
Authors
daSilva, JM; Matos, JS;
Publication
ISCAS '97 - PROCEEDINGS OF 1997 IEEE INTERNATIONAL SYMPOSIUM ON CIRCUITS AND SYSTEMS, VOLS I - IV: CIRCUITS AND SYSTEMS IN THE INFORMATION AGE
Abstract
The detection and location of faulty passive components is crucial in testing printed circuit boards. This issue is one of the objectives to be satisfied by the development of a mixed-signal test bus standard - IEEE P1149.4 - now on the final phase of evaluation. In this paper a method is presented that enables electronic in-circuit testing for presence and value of passive components, based on the use of analogue boundary modules like those developed under P1149.4, but making use of the positive power supply rail as an analogue test line. This method allows saving one analogue test line while profiting from the eventual presence of current sensors inserted for power supply current monitoring.
1997
Authors
da Silva, JM; Leao, AC; Alves, JC; Matos, JS;
Publication
ITC - INTERNATIONAL TEST CONFERENCE 1997, PROCEEDINGS: INTEGRATING MILITARY AND COMMERCIAL COMMUNICATIONS FOR THE NEXT CENTURY
Abstract
The development of a mixed-signal test bus infrastructure - IEEE P1149.4 - is now in the final stages of the standardization process. Evaluating the test capabilities enabled by this infrastructure is an important step needed to support it as a well established standard. This paper presents experiments carried out with a test chip provided by the P1149.4 working group, which explore the architecture of the proposed analog boundary module to implement alternative testing methods. These include a method for parametric testing of passive components based on the monitoring of the power supply current, and a mixed current/voltage technique allowing the implementation of correlation for testing analog and mixed-signal macros.
2005
Authors
Silva, JM; Mendonça, H;
Publication
The International Series in Engineering and Computer Science - Dynamic Characterisation of Analogue-to-Digital Converters
Abstract
2005
Authors
Silva, JM; Mendonça, H; Mazoleni, S;
Publication
The International Series in Engineering and Computer Science - Dynamic Characterisation of Analogue-to-Digital Converters
Abstract
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