2022
Authors
Luo, Q; Gao, S; Hu, W; Liu, W; Pessoa, LM; Sobhy, M; Sun, YC;
Publication
IEEE COMMUNICATIONS MAGAZINE
Abstract
In this article, a proof-of-concept study on the use of a hybrid design technique to reduce the number of phase shifters of a beam-scanning reflectarray (RA) is presented. An extended hemispherical lens antenna with feeds inspired by the retrodirective array is developed as a reflecting element, and the hybrid design technique mixes the lenses with the microstrip patch elements to realize a reflecting surface. Compared to the conventional designs that only use microstrip antennas to realize a reflecting surface, given a fixed aperture size the presented design uses 25 percent fewer array elements while shows comparable beam-steering performance. As a result of using fewer elements, the number of required phase shifters or other equivalent components such as RF switches and tunable materials is reduced by 25 percent, which leads to the reduction of the overall antenna system's complexity, cost, and power consumption. To verify the design concept, two passive prototypes with a center frequency at 12.5 GHz were designed and fabricated. The reflecting surface was fabricated by using standard PCB manufacturing and the lenses were fabricated using 3D printing. Good agreement between the simulation and measurement results is obtained. The presented design concept can be extended to the design of RAs operating at different frequency bands including millimetre-wave frequencies with similar radiation performances. The presented design method is not limited to the microstrip patch reflecting elements and can also be applied to the design of the hybrid RAs with different types of reflecting elements.
2022
Authors
Domingues, I; Sequeira, AF;
Publication
COMPUTATIONAL AND MATHEMATICAL ORGANIZATION THEORY
Abstract
2022
Authors
Sequeira, AE; Gomez Barrero, M; Damer, N; Correia, PL;
Publication
IET BIOMETRICS
Abstract
2022
Authors
Brömme A.; Damer N.; Gomez-Barrero M.; Raja K.; Rathgeb C.; Sequeira A.F.; Todisco M.; Uhl A.;
Publication
BIOSIG 2022 - Proceedings of the 21st International Conference of the Biometrics Special Interest Group
Abstract
2022
Authors
Ding, C; Pereira, T; Xiao, R; Lee, RJ; Hu, X;
Publication
SENSORS
Abstract
Label noise is omnipresent in the annotations process and has an impact on supervised learning algorithms. This work focuses on the impact of label noise on the performance of learning models by examining the effect of random and class-dependent label noise on a binary classification task: quality assessment for photoplethysmography (PPG). PPG signal is used to detect physiological changes and its quality can have a significant impact on the subsequent tasks, which makes PPG quality assessment a particularly good target for examining the impact of label noise in the field of biomedicine. Random and class-dependent label noise was introduced separately into the training set to emulate the errors associated with fatigue and bias in labeling data samples. We also tested different representations of the PPG, including features defined by domain experts, 1D raw signal and 2D image. Three different classifiers are tested on the noisy training data, including support vector machine (SVM), XGBoost, 1D Resnet and 2D Resnet, which handle three representations, respectively. The results showed that the two deep learning models were more robust than the two traditional machine learning models for both the random and class-dependent label noise. From the representation perspective, the 2D image shows better robustness compared to the 1D raw signal. The logits from three classifiers are also analyzed, the predicted probabilities intend to be more dispersed when more label noise is introduced. From this work, we investigated various factors related to label noise, including representations, label noise type, and data imbalance, which can be a good guidebook for designing more robust methods for label noise in future work.
2022
Authors
Torto, IR; Patrício, C; Montenegro, H; Gonçalves, T;
Publication
Proceedings of the Working Notes of CLEF 2022 - Conference and Labs of the Evaluation Forum, Bologna, Italy, September 5th - to - 8th, 2022.
Abstract
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