Abstract
ATM, the Asynchronous Transfer Mode cell-based switching technique, was finally recognized in 1992 by the relevant International standardization entities, as the switching and multiplexing solution for implementing the future Broadband Integrated Services Digital Network (B-ISDN). Because of its service-independent characteristics. ATM will provide B-ISDN with capabilities for integrated support of a wide range of services in a very flexible and efficient way. Transmission of multimedia services in the B-ISDN is currently being addressed by several Study Groups of ITU-T and ETSI. In addition to identifying the required network capabilities and to defining the functional model of multimedia services in the B-ISDN, the possible alternatives for performing the multiplexing operation of the different components of a multimedia application are also being evaluated. The MPEG2 standard (ISO/IEC 13818), which is now in its final phase of specification, is being accepted worldwide as the appropriate coding technique to implement almost all types of video applications and multimedia services involving good-quality fullmotion video. It seems therefore important to evaluate the alternatives for performing the multiplexing operation of the elementary components of an MPEG2-based multimedia application over ATM networks. In fact, different Study Groups of both ITU-T and ETSI, as well as the ATM Forum, are now evaluating alternatives for. mapping MPEG2 streams into ATM cells.

Abstract
This paper investigates the use of mixed-signal test support ICs to extend a digital, board level test infrastructure to the analog section of a mixed-signal board. The architecture of a prototype test support IC is described and its application to the test of an infrared emitter-receiver board is discussed.

Abstract

Abstract

Abstract
The increasing complexity of mixed-signal boards makes an integrated analogue/digital testability approach an attractive proposition. This paper investigates one such approach based on the use of mixed-signal test support ICs together with standard board level test infrastructures. The architecture of a test support IC and preliminary experimental results are also presented.

Abstract
The paper discusses the need of a test infrastructure to support the testing of mixed-signal electronic systems, and discusses a general architecture for test support ICs that can be used to build it. An implementation of a subset of this architecture is described together with its application in a practical example.